| Scanning Electron Microscope |
 Scanning Electron MicroscopeThe Bergen County Academies is among the first high schools to have a scanning electron microscope (SEM). A scanning electron microscope is much more advanced than an average light microscope. Instead of using light to image specimens, the SEM uses a beam of electrons which provides a resolution of up to 3.5 nm, or 3.5 billionths of a meter. Our dual beam instrument can be used for imaging, milling or cutting, platinum deposition and x-ray compositional microanalyses. SEM Slideshow Published On: 6/15/2009 8:42:53 AM |
